Citation:
Luo W, Zhu R, Shao H, Xu X, Zhou Y, HUANG R, Tang K. Decoupling Polarization and Charges by In-Situ Vmid Extraction for Insight Into Trapping Dynamics of FeMFET. IEEE Electron Device Letters. 2025;46:1321-1324.
唐克超（Kechao Tang）
北京大学集成电路学院，助理教授，研究员/ Assistant Professor
School of Integrated circuits, Peking University
tkch@pku.edu.cn
(email)
