Decoupling Polarization and Charges by In-Situ Vmid Extraction for Insight Into Trapping Dynamics of FeMFET - Luo, Wenpu; Zhu, Runteng; Shao, Hanyong; Xu, Xiaojian; Zhou, Yuejia; Ru HUANG; Tang, Kechao (IEEE Electron Device Letters, 2025)
Keywords: accuracy; calibration; Computed tomography; Data models; FeFET dynamics; FeFETs; FeMFET; Ferroelectric FET (FeFET); Hafnium compounds; Logic gates; MFMIS-FeFET; polarization and charge trapping; Semiconductor device modeling; Switches; Thin film transistors; trap modeling