Tang K, Scheuermann AG, Zhang L, McIntyre PC. Series resistance and gate leakage correction for improved border trap analysis of Al₂O₃/InGaAs gate stacks. Journal of Applied Physics [Internet]. 2017;122:094503. 链接（Link）

Tang K, Palumbo FR, Zhang L, Droopad R, McIntyre PC. Interface Defect Hydrogen Depassivation and Capacitance–Voltage Hysteresis of Al₂O₃/InGaAs Gate Stacks. ACS Applied Materials and Interfaces [Internet]. 2017;9:7819-7825. 链接（Link）

Tang K, Meng AC, Hui F, Shi Y, Petach T, Hitzman C, Koh AL, Goldhaber-Gordon D, Lanza M, McIntyre PC. Distinguishing Oxygen Vacancy Electromigration and Conductive Filament Formation in TiO₂ Resistance Switching Using Liquid Electrolyte Contacts. Nano Letters [Internet]. 2017;17:4390-4399. 链接（Link）