A BEOL FeFET based Multi-bit ACiM Macro with High Accuracy and Throughput via Device-Array-System Co-Optimization for Edge LM

Citation:

Zhu R, Ning Z, Shao H, Dai G, Xu X, Yao W, Zhou Y, Huang W, Yu M, Sun C, et al. A BEOL FeFET based Multi-bit ACiM Macro with High Accuracy and Throughput via Device-Array-System Co-Optimization for Edge LM, in 2025 IEEE International Electron Devices Meeting (IEDM).; 2025:1-4.