<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Zhu, Runteng</style></author><author><style face="normal" font="default" size="100%">Ning, Zhiyuan</style></author><author><style face="normal" font="default" size="100%">Shao, Hanyong</style></author><author><style face="normal" font="default" size="100%">Dai, Guangnan</style></author><author><style face="normal" font="default" size="100%">Xu, Xiaojian</style></author><author><style face="normal" font="default" size="100%">Yao, Wenshuai</style></author><author><style face="normal" font="default" size="100%">Zhou, Yuejia</style></author><author><style face="normal" font="default" size="100%">Huang, Weiqin</style></author><author><style face="normal" font="default" size="100%">Yu, Mingxiang</style></author><author><style face="normal" font="default" size="100%">Sun, Chuanlin</style></author><author><style face="normal" font="default" size="100%">Qi, Siyuan</style></author><author><style face="normal" font="default" size="100%">Yang, Jinghao</style></author><author><style face="normal" font="default" size="100%">Luo, Wenpu</style></author><author><style face="normal" font="default" size="100%">Liu, Zhiqi</style></author><author><style face="normal" font="default" size="100%">Dong, Junchen</style></author><author><style face="normal" font="default" size="100%">Zhang, Yihan</style></author><author><style face="normal" font="default" size="100%">Tang, Kechao</style></author><author><style face="normal" font="default" size="100%">Ru HUANG</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">A BEOL FeFET based Multi-bit ACiM Macro with High Accuracy and Throughput via Device-Array-System Co-Optimization for Edge LM</style></title><secondary-title><style face="normal" font="default" size="100%">2025 IEEE International Electron Devices Meeting (IEDM)</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">accuracy</style></keyword><keyword><style  face="normal" font="default" size="100%">Current measurement</style></keyword><keyword><style  face="normal" font="default" size="100%">FeFETs</style></keyword><keyword><style  face="normal" font="default" size="100%">Programming</style></keyword><keyword><style  face="normal" font="default" size="100%">Reliability</style></keyword><keyword><style  face="normal" font="default" size="100%">Robustness</style></keyword><keyword><style  face="normal" font="default" size="100%">Throughput</style></keyword><keyword><style  face="normal" font="default" size="100%">Topology</style></keyword><keyword><style  face="normal" font="default" size="100%">Training</style></keyword><keyword><style  face="normal" font="default" size="100%">Weight measurement</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2025</style></year></dates><pages><style face="normal" font="default" size="100%">1-4</style></pages><language><style face="normal" font="default" size="100%">eng</style></language></record></records></xml>