A Compact Writing Scheme for the Reliability Challenges in 1T Multi-level FeFET Array: Variation, Endurance and Write Disturb

Citation:

Zhou Y, Shao H, Huang W, Zhu R, Zhang Y, HUANG R, Tang K. A Compact Writing Scheme for the Reliability Challenges in 1T Multi-level FeFET Array: Variation, Endurance and Write Disturb. IEEE Electron Device Letters. 2024:1-1.