Citation:
Zhou Y, Shao H, Zhu R, Luo W, Huang W, Shan L, HUANG R, Tang K. Hybrid-FE-Layer FeFET With High Linearity and Endurance Toward On-Chip CIM by Array Demonstration. IEEE Electron Device Letters. 2024;45:276-279.
唐克超（Kechao Tang）
北京大学集成电路学院，助理教授，研究员/ Assistant Professor
School of Integrated circuits, Peking University
tkch@pku.edu.cn
(email)
