@article {10371344,
	title = {Hybrid-FE-Layer FeFET With High Linearity and Endurance Toward On-Chip CIM by Array Demonstration},
	journal = {IEEE Electron Device Letters},
	volume = {45},
	number = {2},
	year = {2024},
	pages = {276-279},
	keywords = {FeFET synaptic array, FeFETs, Ferroelectric FET (FeFET), iron, Linearity, neuromorphic computing, on-chip CIM, Performance evaluation, System-on-chip, Task analysis, Training},
	doi = {10.1109/LED.2023.3346030},
	author = {Zhou, Yuejia and Shao, Hanyong and Zhu, Runteng and Luo, Wenpu and Huang, Weiqin and Linbo Shan and Ru HUANG and Tang, Kechao}
}
