Experimental Observation of Extremely Strong Defect-Phonon Scatterings in Semiconductor Single Crystals

Citation:

Huang Z, Liang J, Wang Y, Sun Z, Shigekawa N, Li M, WANG R, Cheng Z. Experimental Observation of Extremely Strong Defect-Phonon Scatterings in Semiconductor Single Crystals. Applied Physics Reviews. 2025.

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