Citation:
Zhou Y, HUANG R, Tang K. Comprehensive Investigation of the Disturb and Retention Issues in Scaled FeNAND Arrays, in 2025 9th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).; 2025:01-03.
唐克超（Kechao Tang）
北京大学集成电路学院，助理教授，研究员/ Assistant Professor
School of Integrated circuits, Peking University
tkch@pku.edu.cn
(email)
