科研成果 by Year: 2007

2007
Xuan Y, Wu YQ, Lin HC, Shen T, Ye PD. Submicrometer inversion-type enhancement-mode InGaAs MOSFET with atomic-layer-deposited Al2O3 as gate dielectric. Ieee Electron Device Letters [Internet]. 2007;28:935-938. 访问链接
Xuan Y, Wu YQ, Shen T, Yang T, Ye PD, Ieee. High performance submicron inversion-type enhancement-mode InGaAs MOSFETs with ALD Al(2)O(3), HfO(2), and HfAlO as gate dielectrics.; 2007 pp. 637-640. 访问链接
Yang T, Xuan Y, Zemlyanov D, Shen T, Wu YQ, Woodall JM, Ye PD, Aguirre-Tostado FS, Milojevic M, McDonnell S, et al. Interface studies of GaAs metal-oxide-semiconductor structures using atomic-layer-deposited HfO2/Al2O3 nanolaminate gate dielectric. Applied Physics Letters [Internet]. 2007;91. 访问链接
Xuan Y, Wu YQ, Lin HC, Shen T, Ye PD. High-performance submicron inversion-type enhancement-mode InGaAs MOSFET with maximum drain current of 360 mA/mm and transconductance of 130 mS/mm.; 2007 pp. 207-8. 访问链接
Wu Y, Ye PD, Capano MA, Shen T, Xuan Y, Sui Y, Qi M, Cooper, James A. J, Ieee. Epitaxially grown graphene field-effect transistors with electron mobility exceeding 1500 cm(2)/Vs and hole mobility exceeding 3400 cm(2)/Vs.; 2007 pp. 554-+. 访问链接
Wu YQ, Xuan Y, Shen T, Ye PD, Cheng Z, Lochtefeld A. Enhancement-mode InP n-channel metal-oxide-semiconductor field-effect transistors with atomic-layer-deposited Al2O3 dielectrics. Applied Physics Letters [Internet]. 2007;91. 访问链接
Wu YQ, Xuan Y, Ye PD, Cheng Z, Lochtefeld A. Inversion-type enhancement-mode InP MOSFETs with ALD AI2O3, HfO2 and HfAlO nanolaminates as high-k gate dielectrics.; 2007 pp. 117-18. 访问链接
Wu YQ, Lin HC, Ye PD, Wilk GD. Current transport and maximum dielectric strength of atomic-layer-deposited ultrathin Al2O3 on GaAs. Applied Physics Letters [Internet]. 2007;90. 访问链接
Wu YQ, Shen T, Ye PD, Wilk GD. Photo-assisted capacitance-voltage characterization of high-quality atomic-layer-deposited Al2O3/GaN metal-oxide-semiconductor structures. Applied Physics Letters [Internet]. 2007;90. 访问链接