Ye PD, Gu JJ, Wu YQ, Xu M, Xuan Y, Shen T, Neal AT.
ALD High-k as a Common Gate Stack Solution for Nano-electronics. In:
Misra D, Chen Z, Iwai H, Bauza D, Chikyow T, Obeng Y Dielectrics for Nanosystems 4: Materials Science, Processing, Reliability, and Manufacturing. Vol. 28. ; 2010. pp. 51-+.
访问链接 Wu Y, Ye PD.
Scaling of InGaAs MOSFETs into deep-submicron. In:
Srinivasan P, Obeng Y, Misra D, Karim Z, DeGendt S Graphene, Ge/Iii-V, and Emerging Materials for Post-Cmos Applications 2. Vol. 28. ; 2010. pp. 185-201.
访问链接 Wrachien N, Cester A, Zanoni E, Meneghesso G, Wu YQ, Ye PD, Ieee.
Degradation of III-V inversion-type enhancement-mode MOSFETs. 2010 International Reliability Physics Symposium [Internet]. 2010:536-542.
访问链接 Wu YQ, Gu JJ, Ye PD, Ieee.
Scaling of InGaAs MOSFETs into deep-submicron regime. In: 2010 22nd International Conference on Indium Phosphide and Related Materials. ; 2010.
访问链接 Wu YQ, Lin YM, Jenkins KA, Ott JA, Dimitrakopoulos C, Farmer DB, Xia F, Grill A, Antoniadis DA, Avouris P, et al. RF Performance of Short Channel Graphene Field-Effect Transistor. In: 2010 International Electron Devices Meeting - Technical Digest. ; 2010.
访问链接 Lin Y-M, Dimitrakopoulos C, Farmer DB, Han S-J, Wu Y, Zhu W, Gaskill KD, Tedesco JL, Myers-Ward RL, Eddy, Charles R. J, et al. Multicarrier transport in epitaxial multilayer graphene. Applied Physics Letters [Internet]. 2010;97.
访问链接