Temperature dependent behavior of thermal conductivity of sub-5 nm Ir film: Defect-electron scattering quantified by residual thermal resistivity

Citation:

Cheng Z, Xu Z, Xu S, Wang X. Temperature dependent behavior of thermal conductivity of sub-5 nm Ir film: Defect-electron scattering quantified by residual thermal resistivity. Journal of Applied Physics. 2015;117(2):024307.

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