Citation:Gao P, Wang Z, Fu W, Liao Z, Liu K, Wang W, Bai X, Wang E. In situ TEM studies of oxygen vacancy migration for electrically induced resistance change effect in cerium oxides. Micron [Internet]. 2010;(4):301-305.ExportDOI BibTex EndNote Tagged EndNote XML WebsiteSCI被引用次数：87. DOI
