@article {10429,
	title = {In situ TEM studies of oxygen vacancy migration for electrically induced resistance change effect in cerium oxides},
	journal = {Micron},
	year = {2010},
	pages = {301-305},
	doi = {10.1016/j.micron.2009.11.010},
	url = {http://www.ncbi.nlm.nih.gov/pubmed/20042340},
	author = {Peng Gao and Zhenzhong Wang and Wangyang Fu and Zhaoliang Liao and Kaihui Liu and Wenlong Wang and Xuedong Bai and Enge Wang}
}
