Citation:
Sviridov DE, Kozlovsky VI, Rong X, Chen G, Wang X, Jmerik VN, Kirilenko DA, Ivanov SV. Nanoscale visualization of electronic properties of AlxGa1-xN/AlyGa1-yN multiple quantum-well heterostructure by spreading resistance microscopy. Journal of Applied Physics. 2017;121:014305.