College graduate's employment quality is one of the most heatedly discussed issues recently. Giving the difference in purposes of talent cultivation in academic and vocational institutions and the difference in individual job-searching strategy, this paper proposes that scholars should compare the difference of job-searching strategy and the gap in actual employment outcome between academic and vocational college graduates and analyze the level of compatibility between vocational graduate's job-searching strategy and their job-searching result, in order to identify the effect of vocational higher education on employment. Using the proposed method, this study finds a great gap in job-hunting strategy among two types of graduates. Vocational higher education significantly affects one's job-hunting strategy and employment result. Besides, vocational graduate's job-hunting strategy indeed influences their employment outcomes. In conclusion, this paper believes that vocational graduates' employment quality is not necessarily worse than that of academic graduates.
In this letter, we have demonstrated that the circular transmission linear model (Marlow's CTLM) is unsuitable for GaN HEMTs structure alloyed ohmic contact resistance evaluation. Very large spread is found in the extracted ohmic resistance values from measured data using the commonly used CTLM test patterns, and some of the contact resistances are found to be negative. We suspect that the stress induced by ohmic contact formation process is the culprit, preventing the use of CTLM test pattern for GaN HEMTs structure ohmic contact resistance evaluation, because of the strong piezoelectric induced polarization property of the hexagonal Ill-nitride heterojunction device structure. Meanwhile, measured ohmic contact resistance (R-c) and sheet resistance (R-sq) are found to exhibit good uniformity using a properly prepared linear transmission line model (LTLM) test pattern in which all the Gallium nitride material extended beyond the gaps between the ohmic contact electrodes are removed.