Jang C, Adam S, Chen J-H, Williams ED, Sarma DS, Fuhrer MS. Tuning the effective fine structure constant in graphene: Opposing effects of dielectric screening on short- and long-range potential scattering. Physical Review Letters. 2008;(14). SCI被引用次数：303.

Chen J-H, Jang C, Xiao S, Ishigami M, Fuhrer MS. Intrinsic and extrinsic performance limits of graphene devices on SiO 2. Nature Nanotechnology [Internet]. 2008;(4):206-209. 访问链接 SCI被引用次数：2364.

Chen J-H, Jang C, Adam S, Fuhrer MS, Williams ED, Ishigami M. Charged-impurity scattering in graphene. Nature Physics. 2008;(5):377-381. SCI被引用次数：1169.