Citation:
Thies M, Wagner F, Huang Y, Gu M, Kling L, Pechmann S, Aust O, Grüneboom A, Schett G, Christiansen S, et al. Calibration by differentiation–Self-supervised calibration for X-ray microscopy using a differentiable cone-beam reconstruction operator. Journal of microscopy. 2022;287:81–92.