Direct Observation of Long Electron-Hole Diffusion Distance in CH3NH3PbI3 Perovskite Thin Film

Citation:

Li Y, Yan W, Li Y, Wang S, Wang W, Bian Z, Xiao L, Gong Q. Direct Observation of Long Electron-Hole Diffusion Distance in CH3NH3PbI3 Perovskite Thin Film. Sci RepSci RepSci Rep. 2015;5:14485.

摘要:

In high performance perovskite based solar cells, CH3NH3PbI3 is the key material. We carried out a study on charge diffusion in spin-coated CH3NH3PbI3 perovskite thin film by transient fluorescent spectroscopy. A thickness-dependent fluorescent lifetime was found. By coating the film with an electron or hole transfer layer, [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) or 2,2',7,7'-tetrakis(N,N-di-p-methoxyphenylamine)-9,9'-spirobifluorene (Spiro-OMeTAD) respectively, we observed the charge transfer directly through the fluorescence quenching. One-dimensional diffusion model was applied to obtain long charge diffusion distances in thick films, which is ~1.7 mum for electrons and up to ~6.3 mum for holes. Short diffusion distance of few hundreds of nanosecond was also observed in thin films. This thickness dependent charge diffusion explained the formerly reported short charge diffusion distance (~100 nm) in films and resolved its confliction to thick working layer (300-500 nm) in real devices. This study presents direct support to the high performance perovskite solar cells and will benefit the devices' design.

附注:

Li, YuYan, WeiboLi, YunlongWang, ShufengWang, WeiBian, ZuqiangXiao, LixinGong, QihuangengEngland2015/09/30 06:00Sci Rep. 2015 Sep 29;5:14485. doi: 10.1038/srep14485.