Colloidal CdS nanorods similar to 4.9 nm in diameter and similar to 60 nm long were positioned in gold bow-tie electrodes with a gap of similar to 50 nm by an AC dielectrophoresis process to construct optoelectronic devices. The fabricated devices exhibited an excellent photoresponse to white and blue light, but no response to green light. However, the response of the devices to white light could be degraded by green light. This is considered to be related to surface plasmon polaritons suppressing the generation of photo-carriers in the CdS nanorods. The results indicate that surface plasmons do not always benefit nano-optoeletronic devices. (C) 2015 The Japan Society of Applied Physics
Recent theoretical predictions and angle-resolved photoemission spectroscopy measurements have shown that single crystal Cd3As2 is a three-dimensional topological Dirac semimetal possessing linear dispersions along all three momentum directions. Nanoscale topological Dirac semimetal structures have a large surface-to-volume ratio and provide a platform to explore its topological surface states. Here we report the synthesis of high quality Cd3As2 single crystalline nanoplates and nano-octahedrons via a vaporsolid growth mechanism. Triangular and hexagonal nanoplates with lateral dimensions ranging from several hundred nanometers to tens of micrometers are obtained. The top facets are (112), consistent with the natural cleavage plane of Cd3As2 single crystal. The synthesized Cd3As2 nano-octahedrons are enclosed by the {112} facets. A photovoltaic effect is demonstrated from a Cd3As2 nanoplate/metal electrode interface, suggesting potential applications in self-powered photodetection.
Tan S, Ma S, Wang S, Gao W. Synthesized Views Distortion Model Based Rate Control in 3D-HEVC, in Advances in Multimedia Information Processing - PCM 2015 - 16th Pacific-Rim Conference on Multimedia, Gwangju, South Korea, September 16-18, 2015, Proceedings, Part II.; 2015:24–32. 访问链接
The temperature dependence of current collapse (CC) in AlGaN/GaN high-electron mobility transistors on silicon substrate is studied in this paper. Devices without and with Si3N4 passivation are used to investigate the behavior of surface- and buffer-induced CC, respectively. It is found that the degree of surface-induced CC in unpassivated devices has a weak temperature dependence, which is induced by the cancelling out between enhanced carrier injection based on surface hopping and enhanced emission when the temperature is increased. On the other hand, the degree of buffer-induced CC in the Si3N4 passivated devices is reduced at higher temperature since the energy of hot electrons is reduced due to the phonon scattering and the trapping of hot electrons in the buffer is mitigated. Temperature-dependent transient measurement is also carried out to investigate the recovery process for these two type of CC. Two types of trap levels are identified in the unpassivated and Si3N4 passivated devices, respectively. The trap level E1 with an activation energy of 0.08 eV is supposed to be related to the surface trapping, while E2 with an activation energy of 0.22 eV is located in the buffer layer.