Multiple plasmon-induced transparencies are numerically predicted in an ultracompact plasmonic structure, comprising series of stub resonators side-coupled with a metal-isolator-metal waveguide. Because of the phase-coupled effect, electromagnetically induced transparency (EIT)-like spectral response occurs between two adjacent stub resonators with detuned resonant wavelengths. In this approach, multiple EIT-like spectral responses, with bandwidths of the order of several nanometers, are obtained in the plasmonic structure with a small footprint of about 0.6 mu m(2). An analytic model and the relative phase analysis based on the scattering matrix theory are used to explain this phenomenon. (C) 2012 Optical Society of America
Modern methods of in situ transmission electron microscopy (TEM) allow one to not only manipulate with a nanoscale object at the nanometer-range precision but also to get deep insights into its physical and chemical statuses. Dedicated TEM holders combining the capabilities of a conventional high-resolution TEM instrument and atomic force -, and/or scanning tunneling microscopy probes become the powerful tools in nanomaterials analysis. This progress report highlights the past, present and future of these exciting methods based on the extensive authors endeavors over the last five years. The objects of interest are diverse. They include carbon, boron nitride and other inorganic one- and two-dimensional nanoscale materials, e.g., nanotubes, nanowires and nanosheets. The key point of all experiments discussed is that the mechanical and electrical transport data are acquired on an individual nanostructure level under ultimately high spatial, temporal and energy resolution achievable in TEM, and thus can directly be linked to morphological, structural and chemical peculiarities of a given nanomaterial.
Dery H, Wu H, Ciftcioglu B, Huang M, Song Y, Kawakami R, Shi J, Krivorotov I, Žutić I, Sham LJ. Nanospintronics based on magnetologic gates. IEEE Transactions on Electron Devices. 2012;(1):259-262.
In this paper, a new method of topological cleanup for quadrilateral mesh is presented. The method first selects a patch of mesh around an irregular node. It then seeks the best connection of the selected patch according to its irregular valence using a new topological operation: small polygon reconnection (SPR). By replacing the original patch with an optimal one that has less irregular valence, mesh quality can be improved. Three applications based on the proposed approach are enumerated: (1) improving the quality of a quadrilateral mesh, (2) converting a triangular mesh to a quadrilateral one, and (3) adapting a triangle generator to a quadrilateral one. The presented method is highly effective in all three applications.
