<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>10</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Lundh, James Spencer</style></author><author><style face="normal" font="default" size="100%">Masten, Hannah N</style></author><author><style face="normal" font="default" size="100%">Sasaki, Kohei</style></author><author><style face="normal" font="default" size="100%">Jacobs, Alan G</style></author><author><style face="normal" font="default" size="100%">Cheng, Zhe</style></author><author><style face="normal" font="default" size="100%">Spencer, Joseph</style></author><author><style face="normal" font="default" size="100%">Lei Chen</style></author><author><style face="normal" font="default" size="100%">Gallagher, James</style></author><author><style face="normal" font="default" size="100%">Koehler, Andrew D</style></author><author><style face="normal" font="default" size="100%">Konishi, Keita</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">AlN-capped β-(AlxGal-x)2O3/Ga2O3 heterostructure field-effect transistors for near-junction thermal management of next generation power devices</style></title><secondary-title><style face="normal" font="default" size="100%">2022 Device Research Conference (DRC)</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2022</style></year></dates><publisher><style face="normal" font="default" size="100%">IEEE</style></publisher><pages><style face="normal" font="default" size="100%">1-2</style></pages><language><style face="normal" font="default" size="100%">eng</style></language></record></records></xml>