<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Shi, Xinhang</style></author><author><style face="normal" font="default" size="100%">Xin Wang</style></author><author><style face="normal" font="default" size="100%">Liu, Shiyuan</style></author><author><style face="normal" font="default" size="100%">Guo, Qi</style></author><author><style face="normal" font="default" size="100%">Lei Sun</style></author><author><style face="normal" font="default" size="100%">Li, Xuefei</style></author><author><style face="normal" font="default" size="100%">Ru HUANG</style></author><author><style face="normal" font="default" size="100%">Wu, Yanqing</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">High-Performance Bilayer WSe 2 pFET with Record I ds= 425 $μ$A/$μ$m and G m= 100 at $μ$S/$μ$m V ds=-1 V By Direct Growth and Fabrication on SiO 2 Substrate</style></title><secondary-title><style face="normal" font="default" size="100%">2022 International Electron Devices Meeting (IEDM)</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2022</style></year></dates><publisher><style face="normal" font="default" size="100%">IEEE</style></publisher><pages><style face="normal" font="default" size="100%">7–1</style></pages><language><style face="normal" font="default" size="100%">eng</style></language></record></records></xml>