<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>6</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Wrachien, N.</style></author><author><style face="normal" font="default" size="100%">Cester, A.</style></author><author><style face="normal" font="default" size="100%">Bari, D.</style></author><author><style face="normal" font="default" size="100%">Zanoni, E.</style></author><author><style face="normal" font="default" size="100%">Meneghesso, G.</style></author><author><style face="normal" font="default" size="100%">Wu, Y. Q.</style></author><author><style face="normal" font="default" size="100%">Ye, P. D.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Effects of channel hot carrier stress on III-V bulk planar MOSFETs</style></title><secondary-title><style face="normal" font="default" size="100%">2012 IEEE International Reliability Physics Symposium</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2012</style></year></dates><urls><web-urls><url><style face="normal" font="default" size="100%">&amp;lt;Go to ISI&amp;gt;://INSPEC:12880156</style></url></web-urls></urls><pages><style face="normal" font="default" size="100%">3D.4.1-7</style></pages><isbn><style face="normal" font="default" size="100%">978-1-4577-1678-2</style></isbn><language><style face="normal" font="default" size="100%">eng</style></language><work-type><style face="normal" font="default" size="100%">Book</style></work-type></record></records></xml>