@article {hu2021improved,
	title = {Improved Low-Frequency Noise in Recessed-Gate E-Mode AlGaN/GaN MOS-HEMTs Under Electrical and Thermal Stress},
	journal = {IEEE Journal of the Electron Devices Society},
	volume = {9},
	year = {2021},
	pages = {511{\textendash}516},
	publisher = {IEEE},
	author = {Hu, Qianlan and Gu, Chengru and Zhan, Dan and Li, Xuefei and Wu, Yanqing}
}
