@article {RN61,
	title = {Degradation of III-V inversion-type enhancement-mode MOSFETs},
	journal = {2010 International Reliability Physics Symposium},
	year = {2010},
	pages = {536-542},
	type = {Journal Article},
	issn = {1541-7026},
	doi = {10.1109/irps.2010.5488775},
	url = {\&lt;Go to ISI\&gt;://WOS:000287515600087},
	author = {Wrachien, N. and Cester, A. and Zanoni, E. and Meneghesso, G. and Wu, Y. Q. and Ye, P. D. and Ieee}
}
