@article {RN53,
	title = {Effects of Positive and Negative Stresses on III-V MOSFETs With Al2O3 Gate Dielectric},
	journal = {Ieee Electron Device Letters},
	volume = {32},
	number = {4},
	year = {2011},
	pages = {488-490},
	type = {Journal Article},
	issn = {0741-3106},
	doi = {10.1109/led.2011.2106107},
	url = {\&lt;Go to ISI\&gt;://WOS:000288664800020},
	author = {Wrachien, N. and Cester, A. and Wu, Y. Q. and Ye, P. D. and Zanoni, E. and Meneghesso, G.}
}
