@book {RN47,
	title = {Effects of Channel Hot Carrier Stress on III-V Bulk Planar MOSFETs},
	series = {2012 Ieee International Reliability Physics Symposium},
	year = {2012},
	type = {Book},
	isbn = {978-1-4577-1679-9},
	url = {\&lt;Go to ISI\&gt;://WOS:000309183100048},
	author = {Wrachien, N. and Cester, A. and Bari, D. and Zanoni, E. and Meneghesso, G. and Wu, Y. Q. and Ye, P. D. and Ieee}
}
