@book {RN48,
	title = {Effects of channel hot carrier stress on III-V bulk planar MOSFETs},
	series = {2012 IEEE International Reliability Physics Symposium},
	year = {2012},
	pages = {3D.4.1-7},
	type = {Book},
	isbn = {978-1-4577-1678-2},
	doi = {10.1109/irps.2012.6241818},
	url = {\&lt;Go to ISI\&gt;://INSPEC:12880156},
	author = {Wrachien, N. and Cester, A. and Bari, D. and Zanoni, E. and Meneghesso, G. and Wu, Y. Q. and Ye, P. D.}
}
