@book {RN58,
	title = {First Experimental Demonstration of Gate-all-around III-V MOSFETs by Top-down Approach},
	series = {2011 Ieee International Electron Devices Meeting},
	year = {2011},
	type = {Book},
	isbn = {978-1-4577-0505-2},
	url = {\&lt;Go to ISI\&gt;://WOS:000300015300194},
	author = {Gu, J. J. and Liu, Y. Q. and Wu, Y. Q. and Colby, R. and Gordon, R. G. and Ye, P. D. and Ieee}
}
