摘要:

Through nanomanipulation inside scanning electron microscope, a carbon nanotube scanning probe microscope tip was made by connecting a carbon nanotube with a silicon atomic force microscope tip. The carbon nanotube scanning probe microscope tip was then tailored to the desired length and end structure by a "nanoknife," which is a carbon nanotube adhered to a metal tip. Through mapping the same carbon nanotube on SiO(2) substrate, it was found that the lateral resolution of the carbon nanotube tips can be improved significantly through sharpening the tip ends, and the sharpened carbon nanotube tips had better performance than commercial silicon tips.

附注:

Wei, X. L. Jiang, A. N. Gao, S. Chen, Q. 6th International Conference on Nanoscience and Technology JUN 04-06, 2007 Beijing, PEOPLES R CHINA Natl Steering Comm Nanotechnol, Natl Ctr Nanosci Technol, Minist Sci & Technol China, Natl Nat Sci Fdn China, Minist Educ China, Chinese Acad Sci, China Assoc Sci & Technol

Website