<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">He Li</style></author><author><style face="normal" font="default" size="100%">Wei, Xianlong</style></author><author><style face="normal" font="default" size="100%">Wu, Gongtao</style></author><author><style face="normal" font="default" size="100%">Gao, Song</style></author><author><style face="normal" font="default" size="100%">Chen, Qing</style></author><author><style face="normal" font="default" size="100%">Peng, Lian-Mao</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Interlayer electrical resistivity of rotated graphene layers studied by in-situ scanning electron microscopy</style></title><secondary-title><style face="normal" font="default" size="100%">Ultramicroscopy</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">Graphene</style></keyword><keyword><style  face="normal" font="default" size="100%">Interlayer electrical resistivity</style></keyword><keyword><style  face="normal" font="default" size="100%">scanning electron microscopy</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2018</style></year></dates><urls><web-urls><url><style face="normal" font="default" size="100%">http://www.sciencedirect.com/science/article/pii/S0304399118300214</style></url></web-urls></urls><volume><style face="normal" font="default" size="100%">193</style></volume><pages><style face="normal" font="default" size="100%">90 - 96</style></pages><language><style face="normal" font="default" size="100%">eng</style></language></record></records></xml>