<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Nuo, Muqin</style></author><author><style face="normal" font="default" size="100%">Zhong, Ming</style></author><author><style face="normal" font="default" size="100%">Fan, Zetao</style></author><author><style face="normal" font="default" size="100%">Lao, Yunhong</style></author><author><style face="normal" font="default" size="100%">Liu, Lifeng</style></author><author><style face="normal" font="default" size="100%">Wang, Maojun</style></author><author><style face="normal" font="default" size="100%">Wei, Jin</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Full-Range Investigation of Drain-Dependent Bidirectional Dynamic Threshold Voltage Shift in Schottky-Type p-GaN Gate HEMT</style></title><secondary-title><style face="normal" font="default" size="100%">IEEE Transactions on Electron Devices</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">Floating p-GaN layer</style></keyword><keyword><style  face="normal" font="default" size="100%">gate-/drain-coupled barrier lowering (GDCBL)</style></keyword><keyword><style  face="normal" font="default" size="100%">HEMTs</style></keyword><keyword><style  face="normal" font="default" size="100%">Junctions</style></keyword><keyword><style  face="normal" font="default" size="100%">Logic gates</style></keyword><keyword><style  face="normal" font="default" size="100%">Rectifiers</style></keyword><keyword><style  face="normal" font="default" size="100%">Schottky-type p-GaN gate HEMT</style></keyword><keyword><style  face="normal" font="default" size="100%">Silicon</style></keyword><keyword><style  face="normal" font="default" size="100%">stress</style></keyword><keyword><style  face="normal" font="default" size="100%">Stress measurement</style></keyword><keyword><style  face="normal" font="default" size="100%">Switches</style></keyword><keyword><style  face="normal" font="default" size="100%">Testing</style></keyword><keyword><style  face="normal" font="default" size="100%">Threshold voltage</style></keyword><keyword><style  face="normal" font="default" size="100%">Vₜₕ shift</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2025</style></year></dates><number><style face="normal" font="default" size="100%">3</style></number><volume><style face="normal" font="default" size="100%">72</style></volume><pages><style face="normal" font="default" size="100%">1021-1026</style></pages><language><style face="normal" font="default" size="100%">eng</style></language></record></records></xml>