@article {sun2022evaluation,
	title = {Evaluation of the border traps in LPCVD Si3N4/GaN/AlGaN/GaN MIS structure with long time constant using quasi-static capacitance voltage method},
	journal = {Japanese Journal of Applied Physics},
	year = {2022},
	publisher = {IOP Publishing},
	url = {https://iopscience.iop.org/article/10.35848/1347-4065/ac711d/meta},
	author = {Sun, Haozhe and Wei Lin and Yin, Ruiyuan and Jianguo Chen and Hao, Yilong and Shen, Bo and Wang, Maojun and Jin, Yufeng}
}
