<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Tang, Kechao</style></author><author><style face="normal" font="default" size="100%">Zhou, Yuejia</style></author><author><style face="normal" font="default" size="100%">Liang, Zhongxin</style></author><author><style face="normal" font="default" size="100%">Ru HUANG</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Reliability Optimization in Hafnium Oxide Based Ferroelectric Field-Effect Transistors (FeFETs)</style></title><secondary-title><style face="normal" font="default" size="100%">2025 9th IEEE Electron Devices Technology &amp;amp; Manufacturing Conference (EDTM)</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">FeFETs</style></keyword><keyword><style  face="normal" font="default" size="100%">Grain size</style></keyword><keyword><style  face="normal" font="default" size="100%">Hafnium oxide</style></keyword><keyword><style  face="normal" font="default" size="100%">Integrated circuit reliability</style></keyword><keyword><style  face="normal" font="default" size="100%">Manufacturing</style></keyword><keyword><style  face="normal" font="default" size="100%">Memory</style></keyword><keyword><style  face="normal" font="default" size="100%">Next generation networking</style></keyword><keyword><style  face="normal" font="default" size="100%">Optimization</style></keyword><keyword><style  face="normal" font="default" size="100%">Reliability</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2025</style></year></dates><pages><style face="normal" font="default" size="100%">1-3</style></pages><language><style face="normal" font="default" size="100%">eng</style></language></record></records></xml>