<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Zhou, Yuejia</style></author><author><style face="normal" font="default" size="100%">Zhu, Runteng</style></author><author><style face="normal" font="default" size="100%">Luo, Wenpu</style></author><author><style face="normal" font="default" size="100%">Xu, Xiaojian</style></author><author><style face="normal" font="default" size="100%">Qi, Siyuan</style></author><author><style face="normal" font="default" size="100%">Ning, Zhiyuan</style></author><author><style face="normal" font="default" size="100%">Liang Chen</style></author><author><style face="normal" font="default" size="100%">Shao, Hanyong</style></author><author><style face="normal" font="default" size="100%">Tang, Kechao</style></author><author><style face="normal" font="default" size="100%">Ru HUANG</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">3D NOR-Type FeFETs with Record Endurance of 1011, Fast Erase of 50 ns, and Immediate Read-After-Write for In-Memory Learning</style></title><secondary-title><style face="normal" font="default" size="100%">2025 Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">Artificial intelligence</style></keyword><keyword><style  face="normal" font="default" size="100%">Degradation</style></keyword><keyword><style  face="normal" font="default" size="100%">Energy efficiency</style></keyword><keyword><style  face="normal" font="default" size="100%">FeFETs</style></keyword><keyword><style  face="normal" font="default" size="100%">Integrated circuit reliability</style></keyword><keyword><style  face="normal" font="default" size="100%">Next generation networking</style></keyword><keyword><style  face="normal" font="default" size="100%">Optimization</style></keyword><keyword><style  face="normal" font="default" size="100%">Three-dimensional displays</style></keyword><keyword><style  face="normal" font="default" size="100%">Very large scale integration</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2025</style></year></dates><pages><style face="normal" font="default" size="100%">1-3</style></pages><language><style face="normal" font="default" size="100%">eng</style></language></record></records></xml>