<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Zhou, Yuejia</style></author><author><style face="normal" font="default" size="100%">Huang, Weiqin</style></author><author><style face="normal" font="default" size="100%">Zhu, Runteng</style></author><author><style face="normal" font="default" size="100%">Ru HUANG</style></author><author><style face="normal" font="default" size="100%">Tang, Kechao</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">A Reliable 2 bit MLC FeFET with High Uniformity and 109 Endurance by Gate Stack and Write Pulse Co-optimization</style></title><secondary-title><style face="normal" font="default" size="100%">2024 IEEE European Solid-State Electronics Research Conference (ESSERC)</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">Device-to-device communication</style></keyword><keyword><style  face="normal" font="default" size="100%">Electric breakdown</style></keyword><keyword><style  face="normal" font="default" size="100%">Endurance</style></keyword><keyword><style  face="normal" font="default" size="100%">Europe</style></keyword><keyword><style  face="normal" font="default" size="100%">FeFETs</style></keyword><keyword><style  face="normal" font="default" size="100%">Gate leakage</style></keyword><keyword><style  face="normal" font="default" size="100%">Grain size</style></keyword><keyword><style  face="normal" font="default" size="100%">Logic gates</style></keyword><keyword><style  face="normal" font="default" size="100%">multi-level cell (MLC) FeFET</style></keyword><keyword><style  face="normal" font="default" size="100%">Optimization</style></keyword><keyword><style  face="normal" font="default" size="100%">pulse scheme</style></keyword><keyword><style  face="normal" font="default" size="100%">Reliability engineering</style></keyword><keyword><style  face="normal" font="default" size="100%">uniformity</style></keyword><keyword><style  face="normal" font="default" size="100%">Writing</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2024</style></year></dates><pages><style face="normal" font="default" size="100%">657-660</style></pages><language><style face="normal" font="default" size="100%">eng</style></language></record></records></xml>