<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Liang, Zhongxin</style></author><author><style face="normal" font="default" size="100%">Tang, Kechao</style></author><author><style face="normal" font="default" size="100%">Dong, Junchen</style></author><author><style face="normal" font="default" size="100%">Li, Qijun</style></author><author><style face="normal" font="default" size="100%">Zhou, Yuejia</style></author><author><style face="normal" font="default" size="100%">Zhu, Runteng</style></author><author><style face="normal" font="default" size="100%">Wu, Yanqing</style></author><author><style face="normal" font="default" size="100%">Han, Dedong</style></author><author><style face="normal" font="default" size="100%">Ru HUANG</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">A Novel High-Endurance FeFET Memory Device Based on ZrO2 Anti-Ferroelectric and IGZO Channel</style></title><secondary-title><style face="normal" font="default" size="100%">2021 IEEE International Electron Devices Meeting (IEDM)</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2021</style></year></dates><pages><style face="normal" font="default" size="100%">17.3.1-17.3.4</style></pages><language><style face="normal" font="default" size="100%">eng</style></language></record></records></xml>