ML-Resistant and Reliable ChainX PUF Based on FeFET Arrays for Resource-Limited IoT Security - Shao, Hanyong; Ning, Zhiyuan; Zhou, Yuejia; Luo, Wenpu; Bin, Xinyu; Meng Li; Tang, Kechao; Ru HUANG (2025 IEEE European Solid-State Electronics Research Conference (ESSERC), 2025)
Keywords: Bit error rate; Computational modeling; Couplings; Entropy; FeFET; FeFETs; Internet of Things; IoT security; ML resistance; Physical unclonable function; PUF; Reliability engineering; resistance; Security