Reliability Optimization in Hafnium Oxide Based Ferroelectric Field-Effect Transistors (FeFETs) - Tang, Kechao; Zhou, Yuejia; Liang, Zhongxin; Ru HUANG (2025 9th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 2025)
Keywords: FeFETs; Grain size; Hafnium oxide; Integrated circuit reliability; Manufacturing; Memory; Next generation networking; Optimization; Reliability