First Demonstration of High Throughput and Reliable Homomorphic Encryption Using FeFET Arrays for Resource-Limited IoT Clients - Shao, Hanyong; Zhou, Yuejia; Ning, Zhiyuan; Luo, Wenpu; Bin, Xinyu; Yang, Jinghao; Tang, Kechao; Ru HUANG (2024 IEEE International Electron Devices Meeting (IEDM), 2024)
Keywords: Electron devices; Energy consumption; FeFETs; Hardware; Homomorphic encryption; Polynomials; Privacy; Reliability; Throughput; Time complexity