A Novel Hybrid-FE-layer FeFET with Enhanced Linearity for On-chip Training of CIM Accelerator - Zhou, Yuejia; Ru HUANG; Tang, Kechao (2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 2024)
Keywords: Capacitors; Ferroelectric FET (FeFET); iron; Linearity; Logic gates; neuromorphic computing; on-chip CIM; System-on-chip; Training; Voltage measurement