@conference {11040627,
	title = {Reliability Optimization in Hafnium Oxide Based Ferroelectric Field-Effect Transistors (FeFETs)},
	booktitle = {2025 9th IEEE Electron Devices Technology \&amp; Manufacturing Conference (EDTM)},
	year = {2025},
	pages = {1-3},
	keywords = {FeFETs, Grain size, Hafnium oxide, Integrated circuit reliability, Manufacturing, Memory, Next generation networking, Optimization, Reliability},
	doi = {10.1109/EDTM61175.2025.11040627},
	author = {Tang, Kechao and Zhou, Yuejia and Liang, Zhongxin and Ru HUANG}
}
