@conference {10719462,
	title = {A Reliable 2 bit MLC FeFET with High Uniformity and 109 Endurance by Gate Stack and Write Pulse Co-optimization},
	booktitle = {2024 IEEE European Solid-State Electronics Research Conference (ESSERC)},
	year = {2024},
	pages = {657-660},
	keywords = {Device-to-device communication, Electric breakdown, Endurance, Europe, FeFETs, Gate leakage, Grain size, Logic gates, multi-level cell (MLC) FeFET, Optimization, pulse scheme, Reliability engineering, uniformity, Writing},
	doi = {10.1109/ESSERC62670.2024.10719462},
	author = {Zhou, Yuejia and Huang, Weiqin and Zhu, Runteng and Ru HUANG and Tang, Kechao}
}
