@article {26650,
	title = {Temperature Dependent Border Trap Response Produced by a Defective Interfacial Oxide Layer in Al2O3/InGaAs Gate Stacks},
	journal = {ACS Applied Materials and Interfaces},
	volume = {8},
	number = {44},
	year = {2016},
	month = {2016/11/09},
	pages = {30601-30607},
	publisher = {American Chemical Society},
	isbn = {1944-8244},
	url = {https://pubs.acs.org/doi/abs/10.1021/acsami.6b10402},
	author = {Tang, Kechao and Meng, Andrew C. and Ravi Droopad and Paul C. McIntyre}
}
