<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Masa Ishigami</style></author><author><style face="normal" font="default" size="100%">J.H. Chen</style></author><author><style face="normal" font="default" size="100%">E.D. Williams</style></author><author><style face="normal" font="default" size="100%">David Tobias</style></author><author><style face="normal" font="default" size="100%">Y.F. Chen</style></author><author><style face="normal" font="default" size="100%">M.S. Fuhrer</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Hooge's constant for carbon nanotube field effect transistors</style></title><secondary-title><style face="normal" font="default" size="100%">Applied Physics Letters</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2006</style></year></dates><language><style face="normal" font="default" size="100%">eng</style></language><issue><style face="normal" font="default" size="100%">20</style></issue><custom7><style face="normal" font="default" size="100%">000237682100079</style></custom7></record></records></xml>