Exciton Drift in Semiconductors under Uniform Strain Gradients: Application to Bent ZnO Microwires - Fu, X. W.; Jacopin, G.; Shahmohammadi, M.; Liu, R.; Benameur, M.; Ganiere, J. D.; J. Feng; Guo, W. L.; Liao, Z. M.; Deveaud, B.; Yu, D. P. (Acs Nano, 2014)