Impact of Thickness and Deposition Temperature of Gate Dielectric on Valence Bands in Silicon Nanowires - Xu, Honghua; He, Yuhui; Chun Fan; Yuning Zhao; Gang DU; Kang, Jinfeng; Han, Ruqi; Liu, Xiaoyan (2009 International Conference on Simulation of Semiconductor Processes and Devices, 2009)