Influence of boundary force on the performance of gate-all-around Ge (110) NW FETs with HfO 2 gate insulator - Xu, Honghua; Liu, Xiaoyan; Gang DU; He, Yuhui; Chun Fan; Han, Ruqi; Kang, Jinfeng (2010 3rd International Nanoelectronics Conference (INEC), 2010)